- Auger Electron (Emission) Spectroscopy
- Electronics: AES
Универсальный русско-английский словарь. Академик.ру. 2011.
Auger Electron (Emission) Spectroscopy
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Auger electron spectroscopy — (AES; Auger pronounced|oːʒeː in French) is a common analytical technique used specifically in the study of surfaces and, more generally, in the area of materials science. Underlying the spectroscopic technique is the Auger effect, as it has come… … Wikipedia
Auger (disambiguation) — Auger can refer to: *Auger, a device for moving material or liquid by means of a rotating helical flighting *Auger shell, a gray or brown shell commonly found at the beach *The Auger weapon, a rifle in the game which drills through walls.*People… … Wikipedia
spectroscopy — spectroscopist /spek tros keuh pist/, n. /spek tros keuh pee, spek treuh skoh pee/, n. the science that deals with the use of the spectroscope and with spectrum analysis. [1865 70; SPECTRO + SCOPY] * * * Branch of analysis devoted to identifying… … Universalium
Auger effect — The Auger effect (pronEng|ˈɔːʒɚ, or Oh jeh) is a phenomenon in physics in which the emission of an electron from an atom causes the emission of a second electron. [GoldBookRef|title=Auger effect|url=http://goldbook.iupac.org/A00520.html] When an… … Wikipedia
Spectroscopy — Analysis of white light by dispersing it with a prism is example of spectroscopy. Spectroscopy ( … Wikipedia
Électron — Traduction à relire Electron → … Wikipédia en Français
Electron — For other uses, see Electron (disambiguation). Electron Experiments with a Crookes tube first demonstrated the particle nature of electrons. In this illustration, the profile of the cross shaped target is projected against the tube face at right… … Wikipedia
Photoemission electron microscopy — (PEEM, also called photoelectron microscopy, PEM) is a widely used type of emission microscopy. PEEM utilizes local variations in electron emission to generate image contrast. The excitation is usually produced by UV light, synchrotron radiation… … Wikipedia
Scanning Electron Microscopy — Microscopie électronique à balayage Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F … Wikipédia en Français
AES — Advanced Encryption Standard (Computing » Security) Advanced Encryption Standard (Computing » Drivers) Advanced Encryption Standard (Computing » Networking) ** A E S Corporation (Business » NYSE Symbols) ** Audio Engineering Society (Community »… … Abbreviations dictionary
List of materials analysis methods — List of materials analysis methods: Contents: Top · 0–9 · A B C D E F G H I J K L M N O P Q R S T U V W X Y Z μSR see Muon spin spectroscopy … Wikipedia
